FEI Extractor Assembly 4035-273-43772 – Electron Gun Extractor Component | FEI SEM/TEM Platform
Engineering Background
The FEI Extractor Assembly (P/N 4035-273-43772 / 0010-75224) is a precision-engineered electrode component integral to the electron gun column of FEI scanning and transmission electron microscopes. Designed to the DHL-0710 drawing standard and qualified to IHS specification 10-D6-A4.5/45-0.37-E319.1, this extractor controls the electrostatic field that draws electrons from the emitter tip, directly governing beam brightness, stability, and probe current. Proper extractor geometry and surface condition are critical to achieving sub-nanometer resolution and long emitter service life.
Product Positioning
Sourced from verified FEI-qualified supply channels, this assembly is positioned as a direct OEM-equivalent replacement for field-worn or contaminated extractors in FEI Quanta, Nova, Helios, Magellan, and Titan series instruments. It is the preferred procurement choice for metrology labs, semiconductor fabs, materials research institutes, and university EM facilities requiring traceable, specification-compliant spare parts without the lead times of direct OEM orders.
Complete Technical Specifications
| Manufacturer | FEI Company (Thermo Fisher Scientific) |
| Part Number (Primary) | 4035-273-43772 |
| Part Number (Alt) | 0010-75224 |
| Drawing Standard | DHL-0710 |
| Revision | 23 |
| IHS Specification | IHS 10-D6-A4.5/45-0.37-E319.1 |
| Component Type | Extractor Assembly (Electron Gun Electrode) |
| Platform Compatibility | FEI SEM / FIB-SEM / TEM Series |
| Aperture Geometry | A4.5 / 45° (per IHS designation) |
| Electrode Gap Parameter | 0.37 mm (nominal) |
| Surface Finish Standard | E319.1 |
| Gross Weight | 2,600 g (packaged) |
| Country of Origin | USA / Netherlands (FEI manufacturing) |
| Condition | New / Refurbished (specify at inquiry) |
Proven Application Environments
- Semiconductor Wafer Inspection – Critical dimension metrology and defect review on 200 mm / 300 mm process lines requiring stable beam current and repeatable landing energy.
- Advanced Materials Research – High-resolution imaging of grain boundaries, dislocations, and nanostructures in academic and national laboratory TEM/SEM facilities.
- FIB-SEM Dual-Beam Systems – Extractor replacement during scheduled preventive maintenance cycles on Helios and Nova NanoLab platforms.
- Failure Analysis Labs – Rapid turnaround replacement to minimize instrument downtime in IC failure analysis workflows.
- Geological & Life Science EM – Environmental SEM (ESEM) and cryo-EM facilities requiring consistent high-vacuum electrode performance.
Engineering Advantages
- OEM-Equivalent Geometry – Manufactured to DHL-0710 drawing tolerances; drop-in replacement with no column realignment required in most cases.
- IHS-Qualified Surface Finish – E319.1 surface specification minimizes field emission irregularities and reduces contamination accumulation on the extractor aperture.
- Traceable Material Certification – Material certificates and dimensional inspection reports available upon request for regulated procurement environments.
- Electrostatic Stability – Precision aperture geometry (A4.5 / 45°) ensures uniform extraction field, reducing beam astigmatism and improving probe current reproducibility.
- Reduced Downtime Risk – In-stock availability at Konmask.com eliminates typical 8–16 week OEM lead times, supporting just-in-time maintenance scheduling.
System Architecture & Signal Flow
In the FEI Schottky field-emission gun (FEG) column, the extractor assembly is positioned immediately above the suppressor electrode and below the first anode (gun lens). The extraction voltage (typically +3 kV to +7 kV relative to the emitter) applied across the extractor aperture creates the electrostatic field that draws electrons from the ZrO/W emitter tip. The extracted beam is then accelerated, shaped by the gun lens, and passed through the column optics to the sample. Degradation of the extractor aperture edge or surface contamination directly increases beam noise, reduces brightness, and can cause high-voltage instability (HV trips). Timely replacement of this assembly restores factory-specification beam performance.
Sourcing & Quality Verification
- All FEI spare parts at Konmask.com are sourced through verified industrial supply channels with documented chain of custody.
- Each unit undergoes visual and dimensional pre-shipment inspection against OEM drawing references.
- Packaging follows ESD-safe and cleanroom-compatible protocols to prevent contamination during transit.
- Certificate of Conformance (CoC) and material traceability documentation available on request.
- For refurbished units: full cleaning, re-polishing to E319.1 standard, and dimensional re-verification are performed prior to dispatch.
Procurement Process
- Confirm Part Number – Verify P/N 4035-273-43772 or cross-reference 0010-75224 against your instrument’s BOM or service manual.
- Submit Inquiry – Contact [email protected] or call +0086 19859288691 with your instrument model and serial number for compatibility confirmation.
- Receive Quotation – Formal quotation with lead time, condition (new/refurbished), and documentation package issued within 1 business day.
- Place Order & Payment – Secure checkout via Konmask.com or bank transfer (T/T) for institutional purchase orders.
- Shipping & Tracking – ESD-safe, export-compliant packaging; DHL / FedEx express available for global delivery. Tracking number provided within 24 hours of dispatch.
- After-Sales Support – Technical installation guidance and post-installation performance verification support available from our engineering team.
Technical FAQ
Q: Is this a new OEM part or a refurbished unit?
A: Both conditions are available. Please specify your requirement at inquiry. New units carry full OEM-equivalent documentation; refurbished units include a re-inspection report.
Q: Which FEI instruments is this extractor compatible with?
A: This assembly is designed for FEI Schottky FEG-based platforms. Compatibility should be confirmed against your specific instrument model and column revision. Contact us with your system serial number for verification.
Q: What is the typical replacement interval?
A: Extractor replacement is typically performed during emitter exchange cycles or when HV instability, reduced beam current, or increased astigmatism is observed. FEI service guidelines recommend inspection at each emitter change.
Q: Can you provide an export license or customs documentation?
A: Yes. We provide commercial invoices, packing lists, and HS code documentation for all international shipments. Export compliance review is conducted for controlled-technology jurisdictions.
Q: What is the lead time?
A: In-stock units ship within 1–3 business days. Out-of-stock items: estimated 2–6 weeks depending on sourcing. Current availability confirmed at inquiry.
© 2026 Konmask.com. All rights reserved.
Original Source: https://Konmask.com
Contact: [email protected] | +0086 19859288691
